13th International Conference on Fracture June 16–21, 2013, Beijing, China -6- a)! Load direction! 200 μm! Figure. 4. Backscattered electron image of the 〈011〉 specimen subjected to stress relaxation tests at 950°C in tension (IP): crystallographic deformation bands at low magnification. 5 μm" Load direction" a)" b)" 500 nm" Figure. 5. Backscattered electron images of the 〈011〉 specimen subjected to stress relaxation tests at 950°C in compression (OP): a) distinct deformation band, b) magnification of a). P-type of rafting of the γ/γʹ′-microstructure. 500 nm! Load direction! Figure. 6. Backscattered electron image of the 〈001〉 specimen subjected to stress relaxation tests at 750°C in compression (OP): twin formation in the γ/γʹ′-microstructure.
RkJQdWJsaXNoZXIy MjM0NDE=